High speed retardation measurement

High speed retardation measurement

Products > Film evaluation > Retardation > RE-200


RE-200 measures low retardation by managing optical axis with high precision(3σ ≦ 0.02°)

#cell gap, retardation, low and high Rth/inline, polarize

 Features  (*option)
  • Possible to measure low(residual) retardation from 0nm

  • High-speed measurement of retardation simultaneously with optical axis detection(the world's fastest equivalent - to 0.1 seconds or less is possible)

  • High repeatability due to no drive unit

  • Less measurement items required to set and easier measurement method

  • Lineup includes various wavelengths in addition to 550nm

  • Rth measurement and omni-directional measurement possible(optional automatic rotation tilt jig is required)

  • *Combined with a tensile tester, photoelasticity can be evaluated simultaneously with the polarization characteristics of the film

Sample size10 x 10mm ~ 100 x 100mm
Wavelength range550nm(standard)
Retardation measurement range0nm ~ 1μm
Axis detection repeatability0.05°(at 3σ)
Detectorpolarization measurement module
Measurement spot diameter2.2 x 2.2mm
Light source100W halogen lamp or LED
Size and weight300(W) x 430(D) x 560(H)mm, approx. 20kg
Measurement item
  • Retardation(ρ[deg.], re[nm])

  • Main axis azimuth(θ [deg.])

  • Ellipticity(ε) / azimuth angle(γ)

  • Three-dimensional refractive index(NxNyNz)

Measurable samples

  • Retardation film, polarizing film, elliptical film, viewing angle improvement film and other functional films

  • Transparent and anisotropic materials such as resin and glass(strain and distortion in glass)

Measured data

> Viewing angle improvement film A

> Viewing angle improvement film B