RETS-100nx is a retardation measuring system for all kinds of films such as an OLED polarizing plate, a laminated retardation film, and a polarizing plate with retardation film for IPS liquid crystal. A method we use to measure laminated film is the 'non-destructive without peeling.' RETS-100nx even measures exceptionally high retardation as 60,000nm with high speed and high precision.
Furthermore, we provide a simple software installing a correction function that copes with misalignment due to sample re-placement to support your operation environment. So you can easily acquire high-precision measurement results.
|Retardation measurement range||0 ~ 60000nm|
|Retardation repeatability||3σ≦0.08nm(crystal wave plate approx. 600nm)|
|Cell gap measurement range||0 ~ 600μm(Δn=0.1)|
|Cell gap repeatability||3σ≦0.005μm(Cell gap approx. 3μｍ, Δn=0.1)|
|Axis detection repeatability||3σ≦0.08°(crystal wave plate approx. 600nm)|
|Wavelength measurement range||400 ~ 800nm(other options available)|
|Spot size||φ7㎜(standard spec.)|
|Light source||100W Halogen lamp|
|Stage(standard)||100㎜ x 100㎜(fixed stage)|
|Size||480(W) x 520(D) x 765(H)mm|
· High retardation measurement
· Multi-layer measurement
· Axial angle correction function
· Automatic XY stage
· Automatic tilt-rotation stage
|Film, optical material|
Retardation(wavelength dispersion), slow axis, Rth*,3D refractive index*, etc.
Absorption axis, degree of polarization, extinction ratio, various chromaticity, various transmittance, etc.
|Liquid crystal cell||Cell gap, pre-tilt angle*, twist angle, bonding angle, etc.|
*requires optional 'Tilt-rotation' stage